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Power Semiconductors Testers

Overview


Designed for poduction, quality assurance and R&D: parameter (charcteristics) and high power tests
High precision measurement with 16 bit resolution
Additional special tests as stability of values (e.g. delta IR), ZTH with approximation function, ...)
High performance µP system with TI TMS320C6701 high end floating point DSP
Digital signal processing for superior accuracy
High speed:
-very fast analog source regulation
-continuos measuring with 100 kS/sec
-low measuring program execution overhead
4wire measurement for power contacts; contact (kelvin) check
User programmable
multiplexer permit testing of complex parts (converter with additional componentes as shunts, temperature sensors, ...)
Windows-like graphical user's interface on a standard PC
Control system interfaces and PLC functions


For more informations please visit:

www.power-semiconductor-tester.com


 
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