Automated test systems are used to check the quality of produced power semiconductors or diodes as well as for the fully automated execution of complex measuring tasks. We offer a variety of different test systems with which electric modules, components and machines can be tested and measured for current flow and voltage. Our services include the custom development of systems according to your requirements as well as the worldwide initial set up of finished systems on site.
Whether large, automated test systems integrated in the production line or small systems for small series or small parts for the desk. Depending on size or functional requirements, we also create individual test systems with mechanical marking, laser marking or with inkjet marking.
What can be tested?
The more extensive and complex the production plant, the more challenging are the requirements for today's test systems. We offer test systems for different applications, always with the option of customization.
Measure all diode-parameters including Power
Measure all parameters of the Power-diodes in a halfbridge/rectifier
Handling system - Full automatic station or manual draw-stations
Measure all parameters of the FET’s on the module (up to 1000A)
Integrated Avalanche-tests (Avalanche test with VBAT max. 90VDC) Full integration in an full automatic handling system
Measure all parameters of the IGBT’s on the module (up to 1000A)
Full integration in an full automatic handling system
RBSOA / SCSOA Testing Depending on the quality standards during the production of different IGBT and MOSFET module types a RBSOA and SCSOA test is performed. The range of systems last from stand-alone laboratory systems with manual feeding to valuate DUTs during the developing process to full automated shift operation production lines. For RBSOA and SCSOA tests it is essential that the DUT undergoes a real stress test during switching and not just turning on and off the DUT. To reach a real stress test several criteria must be fulfilled like
For the High Temperature Reverse Bias tester we have developed a very compact test system. The system is capable to test 4x DUTs with up to +/-6500 V and 200 °C. The system consist of the following:
Laboratory Test-System 300A to measure all parameters of a FET or FET-modules
Including a manual contacting-station.
For a continuous quality control during the production of different electronic semiconductors HTOL Tests are performed. The DUTs are cycled for a specific time (100h -1000h) most of the time under high temperature in a heating chamber. Different JEDEC standards define the individual test for each DUT which is interpreted by the hardware and software. The complete test will be interpreted by analysis tools. The system consist of the following:
For a continuous quality control during the production of different electronic semiconductors thermal cycling tests are performed. During this test electronic semiconductors are heated up due current pulses with a given frequency. In this example 16 rectifier diodes are pulsed with a current up to 200A at the same time. The forward voltage is measured continuously until the voltage drops below a given value which stands for the temperature inside the rectifier diode. Afterwards the rectifier diode is cooled down to a given forward voltage start value and repeats the test. This long-time tests are running more than 500hours which makes a very stable system essential. In this example there are 16 unique test positions which can run independent. Advantages:
Current Cycling tests up to 300 A
The DUT’s are mounted on water-cooled heatsinks. The DUT is powered with high current pulses up to a specified temperature. Is this temperature reached, the switch field select the next DUT and heat it up. After one cycle the temperature of the first DUT is measured and if the temperature is still too high, the DUT will be skipped. The Chiller and the heatsinks are chosen that after one cycle the first part is nearly back on his start-temperature and can be remeasured.
Low volume Production Line ZTH Test-System 150 A and all parameters of a FET or FET-modules
Including a manual contacting-station.
All set point and measuring functions are based upon the measuring module. For calibration, this module is just measured with a suitable instrument, and the result is sent to the tester and stored in non-volatile memory. There are especially no potentiometers involved in calibration. We provide a tool for automatic calibration, based on a calibrated digital multimeter and additional circuitry to cover all measuring ranges. This tool enables especially our international customers to calibrate by themselves or to check the tester’s DC specification periodically. The system generates a calibration report automatically with the comparison of tester and multimeter results.
We have decades of experience in testing power semiconductors.
Since all components of MRS systems are modular, individual systems can be created flexible and completely according to your requirements.
Long-term cooperation with worldwide well-known customers from various industries.
Modern manufacturing technologies as well as compliant quality standards - We develop and produce in our facility in Germany.
Our MRS Test Systems comply with the CE standard and are built according to the specification of the Machinery Directive 2006 / 42 / EC: DIN EN 60204, DIN EN ISO 12100, DIN EN ISO 13849.
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