Measuring Equipment
Automatic measuring machines or test systems are used to check the quality of produced power semiconductors or diodes as well as for the fully automatic execution of complex measuring tasks. MRS offers a variety of different test systems with which electrical modules, components and machines can be tested and measured for current flow and voltage. The services include both the individual development of systems according to customer requirements as well as the worldwide installation of the finished systems on site.
Power Semiconductor Testers
Whether large automated test systems integrated in the production line or small systems for small series or small parts for the desk. Depending on size or functional requirements, MRS creates individual test systems also with mechanical marking, laser marking or with inkjet marking.
What is tested?
- IGBT modules, FET modules, diodes
- Chips made of Si, SiC and GaN
- And much more
- -100V to +100V at max. +/- 100mA
- -2000V to +2000V at max. +/-10mA
- currents up to max. 1000A uni/bidirectional
- Leakage currents in 10µA measuring range (resolution 0.33nA)
- Multiplexer via HV/high current relay according to customer requirements
Testers for Different Requirements
The more extensive and complex the production plant, the more demanding are the requirements for today's test systems. MRS offers its customers test systems for various fields of application, always with the option of individual customization.
Test Systems
- Vz temp. compensated
- IR / DIR temp. compensated
- Vf (mA)
- Vf (Power)
- dVf (ZHT)
- Temperature
- …
- Bunker
- Feeder
- Headwire straightener station
- Cutting station
- Measuring of cutting length
- Measuring station
- Marking station
- Good / waste sorting
- …
- Vz temp. compensated
- IR / DIR (with leakage current compensation)
- Vf (mA)
- Chipfactor
- dVf (Loading)
- Temperature
- …
- With exchangeable adapter-system
- marking
- Good/waste differentiation
- Waste Box with Sensor
- …
- VSD diode
- BVDSS
- VDS
- IDSS (forward/reverse) with leakage current compensation
- DIDSS (forward/reverse) with leakage current compensation
- IGSS / DIGSS
- VGSTH
- RDSON
- ZTH, ZTH loop
- C-Capacitor
- R-Resistor
- R-Shunt
- Temperature
- …
- VSD diode
- VCE, VCESAT
- ICES (forward/reverse) with leakage current compensation
- DICES (forward/reverse) with leakage current compensation
- IGES / DIGES
- VGSTH
- ZTH, ZTH loop
- C-Capacitor
- R-Resistor
- R-Shunt
- Temperature
- …
- A very low stray induction of the complete system otherwise it will be just switching without real stressing during switching
- Accurate data logging with the highest possible resolution for analyzing the measuring results like
- du / dt value
- di / dt value
- switching times
- clamping voltage
- peak voltages
- collector current
- gate voltage
- Complete traceability of each DUT for later analysis saving the measuring data in databases with upload to the company network if necessary.
- Example contact unit 1200 V / 2000 A RBSOA & 1200 V / 8000 A SCSOA with short circuit detection option
- In a full-automated shift operation production line
- Measuring equipment adapted for each product to get the highest possible resolution
- Customized DC Link for each DUT to minimize ESL
- Individual Gatedrive stage
- Contact check unit to ensure the DUT is connected proper before applying high voltage
- Signal Multiplexer for DUTs in half bridge configuration to save money and space instead of using a second oscilloscope
- Short circuit detection option to prevent uncontrolled discharging of the DC Link into the system during a DUT failure preventing welding the DUT to needles and unnecessary maintenance work at a contact unit.
- Industrial PC to control the system and log the data.
- Test system works 72h PC Independent (in case of PC-shutdown).
- The high voltage power supplies.
- A standard meter to monitor the current and voltage.
- A special developed safety system.
- 4x temperature regulators.
- Separate heating and cooling for the 4x DUTs.
- VSD diode
- BVDSS
- IDSS (forward/reverse) with leakage current compensation
- DIDSS (forward/reverse) with leakage current compensation
- IGSS / DIGSS
- VGSTH
- RDSON
- ZTH, ZTH loop
- C-Capacitor
- R-Resistor
- R-Shunt
- …
- Industrial PC to control the system and log the data
- The high power supplies
- A standard Oscilloscope to monitor the current and voltage
- Multiplexer to switch each DUT to the Scope for V-measurement
- Current-limitation for each DUT
- Separate contacting for the 80 DUTs placed into a heating chamber up to 260°C
- Individual voltage and current classification depending on the customers specification.
- cycle patterns are programmable by the customer.
- contact units are designed individual for each product to test.
- Parameter-tests are possible
- DVf-measurement
- Test-time up to 1000 hour
- Chiller for water-cooling
- 10 heatsinks (water-cooled) for 10 Halfbridge-DUT’s
- 10 Type-K temperature measuring points
- VSD diode
- BVDSS
- IDSS (forward/reverse) with leakage current compensation
- DIDSS (forward/reverse) with leakage current compensation
- IGSS / DIGSS
- VGSTH
- RDSON
- ZTH, ZTH loop
- C-Capacitor
- R-Resistor
- R-Shunt
- …
Advantages of the MRS Test Systems

Knowhow and Experience
MRS has decades of experience in testing power semiconductors.

Individual Test Systems
Because all components of MRS systems are modular, individual systems can be created flexibly and according to customer requirements.

Worldwide Test Systems
Long-term cooperation with worldwide renowned customers from a wide range of industries.

Made in Germany
Modern manufacturing technologies as well as recognized quality standards - MRS develops and produces in Germany.

Machinery Directive
The test systems comply with the CE standard and are built under specification of Machinery Directive 2006 / 42 / EG: DIN EN 60204, DIN EN ISO 12100, DIN EN ISO 13849




Machinery Directive
The test systems comply with the CE standard and are built under specification of Machinery Directive 2006 / 42 / EG: DIN EN 60204, DIN EN ISO 12100, DIN EN ISO 13849




Machinery Directive
The test systems comply with the CE standard and are built under specification of Machinery Directive 2006 / 42 / EG: DIN EN 60204, DIN EN ISO 12100, DIN EN ISO 13849
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